{"title":"一个10 Gb/s CMOS半速率时钟和数据恢复电路与直接bang-bang调谐","authors":"Tun-Shih Chen","doi":"10.1109/RFIT.2005.1598873","DOIUrl":null,"url":null,"abstract":"This paper describes the detail design considerations and verification of a 10 Gb/s half-rate clock and data recovery circuit (CDR). This CDR circuit utilizes half-rate bang-bang architecture with additional frequency acquisition loop to ensure proper operation and avoid false locking. Direct bang-bang frequency tuning is applied to eliminate the latency of the charge pump and allow flexible control of the small bang-bang frequency tuning step. The CDR circuit was fabricated in TSMC 0.13 /spl mu/m RF/MS CMOS technology. Experimental results show 1.4 ps rms jitter and 7 ps peak-to-peak jitter generation by 2/sup 31/-1 PRBS at a rate of 10 Gb/s. Jitter transfer bandwidth is about 8 MHz and jitter tolerance has large margin above OC-192 mask. The circuit excluding the output buffers dissipates 86 mW power at 1.5 V power supply. The die size including the pads is 1.3/spl times/1.5 mm/sup 2/.","PeriodicalId":337918,"journal":{"name":"2005 IEEE International Wkshp on Radio-Frequency Integration Technology: Integrated Circuits for Wideband Comm & Wireless Sensor Networks","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A 10 Gb/s CMOS half-rate clock and data recovery circuit with direct bang-bang tuning\",\"authors\":\"Tun-Shih Chen\",\"doi\":\"10.1109/RFIT.2005.1598873\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes the detail design considerations and verification of a 10 Gb/s half-rate clock and data recovery circuit (CDR). This CDR circuit utilizes half-rate bang-bang architecture with additional frequency acquisition loop to ensure proper operation and avoid false locking. Direct bang-bang frequency tuning is applied to eliminate the latency of the charge pump and allow flexible control of the small bang-bang frequency tuning step. The CDR circuit was fabricated in TSMC 0.13 /spl mu/m RF/MS CMOS technology. Experimental results show 1.4 ps rms jitter and 7 ps peak-to-peak jitter generation by 2/sup 31/-1 PRBS at a rate of 10 Gb/s. Jitter transfer bandwidth is about 8 MHz and jitter tolerance has large margin above OC-192 mask. The circuit excluding the output buffers dissipates 86 mW power at 1.5 V power supply. The die size including the pads is 1.3/spl times/1.5 mm/sup 2/.\",\"PeriodicalId\":337918,\"journal\":{\"name\":\"2005 IEEE International Wkshp on Radio-Frequency Integration Technology: Integrated Circuits for Wideband Comm & Wireless Sensor Networks\",\"volume\":\"40 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2005 IEEE International Wkshp on Radio-Frequency Integration Technology: Integrated Circuits for Wideband Comm & Wireless Sensor Networks\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RFIT.2005.1598873\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2005 IEEE International Wkshp on Radio-Frequency Integration Technology: Integrated Circuits for Wideband Comm & Wireless Sensor Networks","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RFIT.2005.1598873","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A 10 Gb/s CMOS half-rate clock and data recovery circuit with direct bang-bang tuning
This paper describes the detail design considerations and verification of a 10 Gb/s half-rate clock and data recovery circuit (CDR). This CDR circuit utilizes half-rate bang-bang architecture with additional frequency acquisition loop to ensure proper operation and avoid false locking. Direct bang-bang frequency tuning is applied to eliminate the latency of the charge pump and allow flexible control of the small bang-bang frequency tuning step. The CDR circuit was fabricated in TSMC 0.13 /spl mu/m RF/MS CMOS technology. Experimental results show 1.4 ps rms jitter and 7 ps peak-to-peak jitter generation by 2/sup 31/-1 PRBS at a rate of 10 Gb/s. Jitter transfer bandwidth is about 8 MHz and jitter tolerance has large margin above OC-192 mask. The circuit excluding the output buffers dissipates 86 mW power at 1.5 V power supply. The die size including the pads is 1.3/spl times/1.5 mm/sup 2/.