条件边缺陷k元n立方的边双环性

Shiying Wang, Shurong Zhang
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引用次数: 0

摘要

k-ary n-cubes类代表了并行和分布式计算系统中最常用的互连拓扑。本文考虑了偶k≥4和n≥2的缺陷k-ary n-立方体,使得k-ary n-立方体的每个顶点与至少两条健康边相关联。基于这一要求,我们研究了k元n立方在边双环性方面的容错能力。我们证明了在k元n立方Qnk中,即使Qnk有多达4n−5个边故障,每个健康边都包含在偶数长度为6 ~ |V(Qnk)|的无故障环中,并且我们的结果就可容忍的边故障数而言是最优的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Edge-bipancyclicity in conditional edge-faulty k-ary n-cubes
The class of k-ary n-cubes represents the most commonly used interconnection topology for parallel and distributed computing systems. In this paper, we consider the faulty k-ary n-cube with even k ≥ 4 and n ≥ 2 such that each vertex of the k-ary n-cube is incident with at least two healthy edges. Based on this requirement, we investigate the fault-tolerant capabilities of the k-ary n-cube with respect to the edge-bipancyclicity. We prove that in the k-ary n-cube Qnk, every healthy edge is contained in fault-free cycles of even lengths from 6 to |V(Qnk)|, even if the Qnk has up to 4n − 5 edge faults and our result is optimal with respect to the number of edge faults tolerated.
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