基于相移技术的全集成SOI波长计

A. Ruocco, W. Bogaerts
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引用次数: 7

摘要

我们提出了一种MZI(马赫-曾德尔干涉仪)绝缘体上硅(SOI)波长计。该装置集成了光电探测器和调制器。载波和调制信号之间的相移与输入波长呈线性相关。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Fully integrated SOI wavelength meter based on phase shift technique
We present an MZI (Mach-Zehnder Interferometer) silicon-on-insulator (SOI) wavelength meter. The device integrates photo detectors and modulators. The phase shift between carrier and modulated signal is linearly correlated to the input wavelength.
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