{"title":"单模通道波导和MMI分束器的制造和表征","authors":"A.A. Muhammad, G.I. Aziz","doi":"10.1109/MELCON.2004.1348273","DOIUrl":null,"url":null,"abstract":"In this work we present a locally developed integrated optics technology for the fabrication and characterization of integrated optical components. The fabrication was carried out using the ion exchange in glass. Both single mode guides and multi-mode interference MMI splitter are, for the first time in Egypt, fabricated and tested. For the characterization purpose, an automated setup is developed in order to scan for the reflection sites within the integrated optical structures.","PeriodicalId":164818,"journal":{"name":"Proceedings of the 12th IEEE Mediterranean Electrotechnical Conference (IEEE Cat. No.04CH37521)","volume":"169 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-05-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Single mode channel waveguide and MMI beam splitter fabrication and characterization\",\"authors\":\"A.A. Muhammad, G.I. Aziz\",\"doi\":\"10.1109/MELCON.2004.1348273\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this work we present a locally developed integrated optics technology for the fabrication and characterization of integrated optical components. The fabrication was carried out using the ion exchange in glass. Both single mode guides and multi-mode interference MMI splitter are, for the first time in Egypt, fabricated and tested. For the characterization purpose, an automated setup is developed in order to scan for the reflection sites within the integrated optical structures.\",\"PeriodicalId\":164818,\"journal\":{\"name\":\"Proceedings of the 12th IEEE Mediterranean Electrotechnical Conference (IEEE Cat. No.04CH37521)\",\"volume\":\"169 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-05-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 12th IEEE Mediterranean Electrotechnical Conference (IEEE Cat. No.04CH37521)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MELCON.2004.1348273\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 12th IEEE Mediterranean Electrotechnical Conference (IEEE Cat. No.04CH37521)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MELCON.2004.1348273","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Single mode channel waveguide and MMI beam splitter fabrication and characterization
In this work we present a locally developed integrated optics technology for the fabrication and characterization of integrated optical components. The fabrication was carried out using the ion exchange in glass. Both single mode guides and multi-mode interference MMI splitter are, for the first time in Egypt, fabricated and tested. For the characterization purpose, an automated setup is developed in order to scan for the reflection sites within the integrated optical structures.