氮化镓晶体管冷却选项比较

P. Skarolek, J. Lettl
{"title":"氮化镓晶体管冷却选项比较","authors":"P. Skarolek, J. Lettl","doi":"10.1109/EDPE.2019.8883894","DOIUrl":null,"url":null,"abstract":"Three methods of cooling gallium nitride (GaN) transistors have been tested and directly compared together. Under similar conditions, top side cooled GaN was compared to the bottom side cooled type; both were of the same electrical parameters and were mounted on FR4 (fibreglass resin) and IMS (insulated metal substrate) printed circuit boards. At equal dissipated power the proposed bottom side cooled transistor on IMS board reaches half the temperature compared to the top side cooled one and one fourth of the temperature compared to the bottom side cooled GaN on FR4 board. A High speed driver is placed close to the transistor also on the IMS board to reduce parasitic inductance of the gate driving path from control board to the high power side on the IMS board.","PeriodicalId":353978,"journal":{"name":"2019 International Conference on Electrical Drives & Power Electronics (EDPE)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"GaN Transistors Cooling Options Comparison\",\"authors\":\"P. Skarolek, J. Lettl\",\"doi\":\"10.1109/EDPE.2019.8883894\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Three methods of cooling gallium nitride (GaN) transistors have been tested and directly compared together. Under similar conditions, top side cooled GaN was compared to the bottom side cooled type; both were of the same electrical parameters and were mounted on FR4 (fibreglass resin) and IMS (insulated metal substrate) printed circuit boards. At equal dissipated power the proposed bottom side cooled transistor on IMS board reaches half the temperature compared to the top side cooled one and one fourth of the temperature compared to the bottom side cooled GaN on FR4 board. A High speed driver is placed close to the transistor also on the IMS board to reduce parasitic inductance of the gate driving path from control board to the high power side on the IMS board.\",\"PeriodicalId\":353978,\"journal\":{\"name\":\"2019 International Conference on Electrical Drives & Power Electronics (EDPE)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 International Conference on Electrical Drives & Power Electronics (EDPE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDPE.2019.8883894\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 International Conference on Electrical Drives & Power Electronics (EDPE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDPE.2019.8883894","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

摘要

对氮化镓(GaN)晶体管的三种冷却方法进行了测试和直接比较。在相同条件下,将顶部冷却型GaN与底部冷却型GaN进行比较;两者具有相同的电气参数,并安装在FR4(玻璃纤维树脂)和IMS(绝缘金属基板)印刷电路板上。在相同的耗散功率下,IMS板上的底部冷却晶体管的温度是顶部冷却晶体管的一半,而FR4板上的底部冷却晶体管的温度是底部冷却晶体管的四分之一。高速驱动器也放置在IMS板上靠近晶体管的地方,以减少从控制板到IMS板上高功率侧的栅极驱动路径的寄生电感。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
GaN Transistors Cooling Options Comparison
Three methods of cooling gallium nitride (GaN) transistors have been tested and directly compared together. Under similar conditions, top side cooled GaN was compared to the bottom side cooled type; both were of the same electrical parameters and were mounted on FR4 (fibreglass resin) and IMS (insulated metal substrate) printed circuit boards. At equal dissipated power the proposed bottom side cooled transistor on IMS board reaches half the temperature compared to the top side cooled one and one fourth of the temperature compared to the bottom side cooled GaN on FR4 board. A High speed driver is placed close to the transistor also on the IMS board to reduce parasitic inductance of the gate driving path from control board to the high power side on the IMS board.
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