{"title":"基于CMOS的非晶硅光子二极管的高性能集成温度传感器","authors":"S. Rao, G. Pangallo, Francesco Delia Corte","doi":"10.5220/0005744903690372","DOIUrl":null,"url":null,"abstract":"A temperature sensor based on a photonic layer-integrated hydrogenated amorphous silicon p-i-n diode is presented. The linear dependence of the voltage drop across the forward-biased diode on temperature, in a range from 30 °C up to 170 °C, has been used for thermal sensing. A high sensitivity of 11.9 mV/°C in a biasing current range ≈34–40 nA has been measured.","PeriodicalId":222009,"journal":{"name":"2016 4th International Conference on Photonics, Optics and Laser Technology (PHOTOPTICS)","volume":"54 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-11-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"High perfomance integrated temperature sensor based on amorphous silicon diode for photonics on CMOS\",\"authors\":\"S. Rao, G. Pangallo, Francesco Delia Corte\",\"doi\":\"10.5220/0005744903690372\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A temperature sensor based on a photonic layer-integrated hydrogenated amorphous silicon p-i-n diode is presented. The linear dependence of the voltage drop across the forward-biased diode on temperature, in a range from 30 °C up to 170 °C, has been used for thermal sensing. A high sensitivity of 11.9 mV/°C in a biasing current range ≈34–40 nA has been measured.\",\"PeriodicalId\":222009,\"journal\":{\"name\":\"2016 4th International Conference on Photonics, Optics and Laser Technology (PHOTOPTICS)\",\"volume\":\"54 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-11-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 4th International Conference on Photonics, Optics and Laser Technology (PHOTOPTICS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.5220/0005744903690372\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 4th International Conference on Photonics, Optics and Laser Technology (PHOTOPTICS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.5220/0005744903690372","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
High perfomance integrated temperature sensor based on amorphous silicon diode for photonics on CMOS
A temperature sensor based on a photonic layer-integrated hydrogenated amorphous silicon p-i-n diode is presented. The linear dependence of the voltage drop across the forward-biased diode on temperature, in a range from 30 °C up to 170 °C, has been used for thermal sensing. A high sensitivity of 11.9 mV/°C in a biasing current range ≈34–40 nA has been measured.