{"title":"容错加法器结构的复杂性","authors":"J. Biernat","doi":"10.1109/DepCoS-RELCOMEX.2008.60","DOIUrl":null,"url":null,"abstract":"To achieve fault-tolerance property of arithmetic circuits several approaches are possible, that differ in the level of hardware redundancy and the coverage of detectable faults. Among them only two are applicable to design of fast fault-tolerant adders. They exploit the concept of residue code or double-rail code. The complexity comparison of the respective fast fault-tolerant adders will be presented.","PeriodicalId":167937,"journal":{"name":"2008 Third International Conference on Dependability of Computer Systems DepCoS-RELCOMEX","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-06-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"The Complexity of Fault-Tolerant Adder Structures\",\"authors\":\"J. Biernat\",\"doi\":\"10.1109/DepCoS-RELCOMEX.2008.60\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"To achieve fault-tolerance property of arithmetic circuits several approaches are possible, that differ in the level of hardware redundancy and the coverage of detectable faults. Among them only two are applicable to design of fast fault-tolerant adders. They exploit the concept of residue code or double-rail code. The complexity comparison of the respective fast fault-tolerant adders will be presented.\",\"PeriodicalId\":167937,\"journal\":{\"name\":\"2008 Third International Conference on Dependability of Computer Systems DepCoS-RELCOMEX\",\"volume\":\"42 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-06-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 Third International Conference on Dependability of Computer Systems DepCoS-RELCOMEX\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DepCoS-RELCOMEX.2008.60\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 Third International Conference on Dependability of Computer Systems DepCoS-RELCOMEX","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DepCoS-RELCOMEX.2008.60","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
To achieve fault-tolerance property of arithmetic circuits several approaches are possible, that differ in the level of hardware redundancy and the coverage of detectable faults. Among them only two are applicable to design of fast fault-tolerant adders. They exploit the concept of residue code or double-rail code. The complexity comparison of the respective fast fault-tolerant adders will be presented.