{"title":"装配线印刷品缺陷快速检测算法","authors":"Ximing Yang, Shuanhu Wu","doi":"10.1109/ICSAI.2012.6223405","DOIUrl":null,"url":null,"abstract":"To better adapt to defect detection requirements of the industrial printed matter on the assembly line, this paper proposed a rapid defect detection algorithm. First we improved the Surf algorithm and made better the detection of the feature point performance and speed effectively; Second, a new FIFO feature point matching algorithm was introduced that could save feature matching time about 50%; Finally we introduced a two-way image difference algorithm to avoid error detecting for contour artifact. Experimental results showed that the proposed algorithm could meet real-time requirements on assembly line.","PeriodicalId":164945,"journal":{"name":"2012 International Conference on Systems and Informatics (ICSAI2012)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"A rapid defect detecting algorithm for printed matter on the assembly line\",\"authors\":\"Ximing Yang, Shuanhu Wu\",\"doi\":\"10.1109/ICSAI.2012.6223405\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"To better adapt to defect detection requirements of the industrial printed matter on the assembly line, this paper proposed a rapid defect detection algorithm. First we improved the Surf algorithm and made better the detection of the feature point performance and speed effectively; Second, a new FIFO feature point matching algorithm was introduced that could save feature matching time about 50%; Finally we introduced a two-way image difference algorithm to avoid error detecting for contour artifact. Experimental results showed that the proposed algorithm could meet real-time requirements on assembly line.\",\"PeriodicalId\":164945,\"journal\":{\"name\":\"2012 International Conference on Systems and Informatics (ICSAI2012)\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-05-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 International Conference on Systems and Informatics (ICSAI2012)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICSAI.2012.6223405\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 International Conference on Systems and Informatics (ICSAI2012)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSAI.2012.6223405","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A rapid defect detecting algorithm for printed matter on the assembly line
To better adapt to defect detection requirements of the industrial printed matter on the assembly line, this paper proposed a rapid defect detection algorithm. First we improved the Surf algorithm and made better the detection of the feature point performance and speed effectively; Second, a new FIFO feature point matching algorithm was introduced that could save feature matching time about 50%; Finally we introduced a two-way image difference algorithm to avoid error detecting for contour artifact. Experimental results showed that the proposed algorithm could meet real-time requirements on assembly line.