{"title":"高速金属-半导体-金属光电探测器的设计:基于优化的方法","authors":"Kan-Lin Hsiung","doi":"10.1109/DELTA.2006.33","DOIUrl":null,"url":null,"abstract":"The finger sizing of interdigitated Schottky-barrier metal-semiconductor-metal photodetectors (MSM-PD) is discussed in this paper. We observe that a MSM-PD geometry with fast response speed can be determined by solving a special form of optimization problem called posynomial programming, for which very efficient global optimization methods have been developed. Our method, therefore, yields completely automated finger sizing of MSM-PD, directly from specifications.","PeriodicalId":439448,"journal":{"name":"Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Design of high-speed metal-semiconductor-metal photodetectors: an optimization-based approach\",\"authors\":\"Kan-Lin Hsiung\",\"doi\":\"10.1109/DELTA.2006.33\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The finger sizing of interdigitated Schottky-barrier metal-semiconductor-metal photodetectors (MSM-PD) is discussed in this paper. We observe that a MSM-PD geometry with fast response speed can be determined by solving a special form of optimization problem called posynomial programming, for which very efficient global optimization methods have been developed. Our method, therefore, yields completely automated finger sizing of MSM-PD, directly from specifications.\",\"PeriodicalId\":439448,\"journal\":{\"name\":\"Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06)\",\"volume\":\"15 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-01-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DELTA.2006.33\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DELTA.2006.33","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Design of high-speed metal-semiconductor-metal photodetectors: an optimization-based approach
The finger sizing of interdigitated Schottky-barrier metal-semiconductor-metal photodetectors (MSM-PD) is discussed in this paper. We observe that a MSM-PD geometry with fast response speed can be determined by solving a special form of optimization problem called posynomial programming, for which very efficient global optimization methods have been developed. Our method, therefore, yields completely automated finger sizing of MSM-PD, directly from specifications.