一种新型线性测量光学电压传感器

2017 2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM) Pub Date : 2017-11-01 DOI:10.1109/ICAM.2017.8242157

Xian Su, Qifeng Xu, Hao Chen

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引用次数: 1

摘要

本文提出了一种基于Mach-Zehnder干涉仪的OVT，将电光相位延迟转化为干涉条纹的位移。然后，通过定位条纹位移得到施加在电光晶体上的电压，并通过实验验证了该方法的有效性。新的OVT满足0.5%精度等级的要求。具有直接线性测量、不受光强影响、测量范围不受晶体半波电压限制等优点。此外，新的OVT简单，易于建立。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A new optical voltage sensor for linear measurement

An OVT based on Mach-Zehnder interferometer is proposed in this paper, which helps to convert the electro-optic phase delay into the displacement of the interference fringe. And then, the voltage applied to the electro-optic crystal is obtained by positioning the displacement of the fringe, and the effectiveness of this method is verified by experiments. The new OVT meets the requirements of 0.5% accuracy class. And it has advantages of direct linear measurement, independent of light intensity and no limit by half wave voltage of crystal in measurement range. Moreover the new OVT is simple and easy to be built up.

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来源期刊

2017 2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM)

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