基于注入锁环振荡器的1.6 Gbps时钟恢复缺相环

D. Vert, J. Bégueret, M. Pignol, F. Malou, V. Lebre, E. Moutaye
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引用次数: 0

摘要

提出了一种基于180nm CMOS技术的注入锁相环(PLL)的概念验证。目标数据速率为1.6 Gbps,电源电压为1.8 V。该架构基于锁相环内实现的注入锁定环形振荡器,有助于改善振荡器抖动,从而降低相位噪声。此外,一个完全对称的异或门作为鉴相器,可以在简化设计的同时获得低相位噪声。该电路在1mhz时的相位噪声为-119.1 dBc/Hz,参考频率为1.6 GHz时的抖动为0.6 mUI。布局后仿真结果表明,注入频率为1.6 GHz时锁相环锁定时间为20 ns,锁相环功耗为41.4 mW。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Injection-Locked Ring Oscillator based Phase-Lacked-Loop for 1.6 Gbps Clock Recovery
This paper submits a proof of concept of an injection-locked Phase-Locked-Loop (PLL) in 180 nm CMOS technology. The target data rate is 1.6 Gbps with a supply voltage of 1.8 V. The architecture is based on an injection-locked ring oscillator implemented in a PLL that helps improving the oscillator jitter and thus the phase noise. In addition, a fully symmetrical XOR gate as phase detector allows to get a low phase noise while simplifying the design. This circuit achieves a phase noise of -119.1 dBc/Hz at 1 MHz and a jitter of 0.6 mUI with a reference frequency of 1.6 GHz. Post-layout simulation results show a PLL locking time with injection at 1.6 GHz of 20 ns while consuming 41.4 mW.
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