MEMS、可编程和合成频率控制器件与传统石英基器件的比较分析

R. Henry, D. Kenny
{"title":"MEMS、可编程和合成频率控制器件与传统石英基器件的比较分析","authors":"R. Henry, D. Kenny","doi":"10.1109/FREQ.2008.4623027","DOIUrl":null,"url":null,"abstract":"Over the years there has been a natural evolution of frequency control devices. This has come about due to the various requirements, some being cost driven, others performance/reliability issues and others by the ever reducing design cycle times. The incumbent quartz based devices have long since been the standard by which most of the new invention devices are compared, at least from a marketing standpoint. This is due to the long (some 75 years) history of quartz as a very stable, high quality material. Frequency versus temperature response as well as aging, jitter and phase noise characteristics are well chronicled in the industry. However a concise technical correlation of such characteristics with the dasiareplacementpsila technology is rather elusive. This exercise seeks to apply standard measurement techniques under the same test conditions for all devices for direct comparison of performance and capability. All devices characterized in this paper were commercially purchased to ensure a random sampling of the technology. This data represents the technology that was commercially available at the time of the study.","PeriodicalId":220442,"journal":{"name":"2008 IEEE International Frequency Control Symposium","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"24","resultStr":"{\"title\":\"Comparative analysis of MEMS, programmable, and synthesized frequency control devices versus traditional quartz based devices\",\"authors\":\"R. Henry, D. Kenny\",\"doi\":\"10.1109/FREQ.2008.4623027\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Over the years there has been a natural evolution of frequency control devices. This has come about due to the various requirements, some being cost driven, others performance/reliability issues and others by the ever reducing design cycle times. The incumbent quartz based devices have long since been the standard by which most of the new invention devices are compared, at least from a marketing standpoint. This is due to the long (some 75 years) history of quartz as a very stable, high quality material. Frequency versus temperature response as well as aging, jitter and phase noise characteristics are well chronicled in the industry. However a concise technical correlation of such characteristics with the dasiareplacementpsila technology is rather elusive. This exercise seeks to apply standard measurement techniques under the same test conditions for all devices for direct comparison of performance and capability. All devices characterized in this paper were commercially purchased to ensure a random sampling of the technology. This data represents the technology that was commercially available at the time of the study.\",\"PeriodicalId\":220442,\"journal\":{\"name\":\"2008 IEEE International Frequency Control Symposium\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-05-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"24\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 IEEE International Frequency Control Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/FREQ.2008.4623027\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 IEEE International Frequency Control Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FREQ.2008.4623027","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 24

摘要

多年来,频率控制装置有了自然的发展。这是由于各种各样的需求,一些是成本驱动的,另一些是性能/可靠性问题,还有一些是不断减少的设计周期时间。在位的石英基器件早已成为大多数新发明器件比较的标准,至少从市场的角度来看是这样。这是由于石英作为一种非常稳定的高质量材料的悠久历史(约75年)。频率与温度响应以及老化、抖动和相位噪声特性在行业中都得到了很好的记录。然而,这些特征与dasiareplacementpsila技术的简明技术关联是相当难以捉摸的。这项工作旨在在相同的测试条件下对所有设备应用标准测量技术,以直接比较性能和能力。本文中描述的所有设备都是在商业上购买的,以确保该技术的随机抽样。这些数据代表了在研究时商业上可用的技术。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Comparative analysis of MEMS, programmable, and synthesized frequency control devices versus traditional quartz based devices
Over the years there has been a natural evolution of frequency control devices. This has come about due to the various requirements, some being cost driven, others performance/reliability issues and others by the ever reducing design cycle times. The incumbent quartz based devices have long since been the standard by which most of the new invention devices are compared, at least from a marketing standpoint. This is due to the long (some 75 years) history of quartz as a very stable, high quality material. Frequency versus temperature response as well as aging, jitter and phase noise characteristics are well chronicled in the industry. However a concise technical correlation of such characteristics with the dasiareplacementpsila technology is rather elusive. This exercise seeks to apply standard measurement techniques under the same test conditions for all devices for direct comparison of performance and capability. All devices characterized in this paper were commercially purchased to ensure a random sampling of the technology. This data represents the technology that was commercially available at the time of the study.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信