用于捕捉瞬时延迟退化和电源电压下降的时间切片环形振荡器

IEEE Custom Integrated Circuits Conference 2006 Pub Date : 2006-09-01 DOI:10.1109/CICC.2006.320990

Takashi Sato, Yu Matsumoto, K. Hirakimoto, M. Komoda, J. Mano

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引用次数: 11

摘要

提出了一种时间切片环振荡器(TSRO)，用于捕获供电网络上瞬时电压降引起的动态延迟退化。直接测量了电压降对延时的影响，得到了时域有效电压降波形。TSRO仅由标准逻辑单元组成，因此几乎适用于现场测量的逻辑电路中的任何地方。采用90纳米工艺的测试芯片的测量结果成功地验证了其概念

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A Time-Slicing Ring Oscillator for Capturing Instantaneous Delay Degradation and Power Supply Voltage Drop

A time-slicing ring oscillator (TSRO) which captures dynamic delay degradation due to instantaneous voltage drop on a power supply network is proposed. Voltage drop impact on delay is directly measured and time-domain effective voltage drop waveforms is also obtained. The TSRO consists of standard logic cells only hence fits almost anywhere in logic circuits for in-situ measurements. Measurement results of a test chip using 90-nm process successfully proved its concept

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IEEE Custom Integrated Circuits Conference 2006

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