{"title":"分柱介质谐振器电阻率扫描的反卷积空间分辨率改进技术","authors":"P. Korpas","doi":"10.23919/MIKON.2018.8405279","DOIUrl":null,"url":null,"abstract":"Resistivity scans of inhomogeneous samples obtained with the technique based on Split-Post Dielectric Resonator suffer from limited spatial resolution due to weighted averaging of the complex permittivity distribution over the sample's volume. A deconvolution-based technique is proposed to increase the resolution of scans as well as to enable measurement of homogeneous samples which do not meet the minimal dimensions criterion for the given resonator.","PeriodicalId":143491,"journal":{"name":"2018 22nd International Microwave and Radar Conference (MIKON)","volume":"308 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Deconvolution-based spatial resolution improvement technique for resistivity scans acquired with split-post dielectric resonator\",\"authors\":\"P. Korpas\",\"doi\":\"10.23919/MIKON.2018.8405279\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Resistivity scans of inhomogeneous samples obtained with the technique based on Split-Post Dielectric Resonator suffer from limited spatial resolution due to weighted averaging of the complex permittivity distribution over the sample's volume. A deconvolution-based technique is proposed to increase the resolution of scans as well as to enable measurement of homogeneous samples which do not meet the minimal dimensions criterion for the given resonator.\",\"PeriodicalId\":143491,\"journal\":{\"name\":\"2018 22nd International Microwave and Radar Conference (MIKON)\",\"volume\":\"308 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-05-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 22nd International Microwave and Radar Conference (MIKON)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/MIKON.2018.8405279\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 22nd International Microwave and Radar Conference (MIKON)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/MIKON.2018.8405279","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Deconvolution-based spatial resolution improvement technique for resistivity scans acquired with split-post dielectric resonator
Resistivity scans of inhomogeneous samples obtained with the technique based on Split-Post Dielectric Resonator suffer from limited spatial resolution due to weighted averaging of the complex permittivity distribution over the sample's volume. A deconvolution-based technique is proposed to increase the resolution of scans as well as to enable measurement of homogeneous samples which do not meet the minimal dimensions criterion for the given resonator.
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