{"title":"弹性设计模式模型","authors":"M. Kumar, C. Engelmann","doi":"10.1109/FTXS51974.2020.00008","DOIUrl":null,"url":null,"abstract":"Resilience plays an important role in supercomputers by providing correct and efficient operation in case of faults, errors, and failures. Resilience design patterns offer blueprints for effectively applying resilience technologies. Prior work focused on developing initial efficiency and performance models for resilience design patterns. This paper extends it by (1) describing performance, reliability, and availability models for all structural resilience design patterns, (2) providing more detailed models that include flowcharts and state diagrams, and (3) introducing the Resilience Design Pattern Modeling (RDPM) tool that calculates and plots the performance, reliability, and availability metrics of individual patterns and pattern combinations.","PeriodicalId":123780,"journal":{"name":"2020 IEEE/ACM 10th Workshop on Fault Tolerance for HPC at eXtreme Scale (FTXS)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Models for Resilience Design Patterns\",\"authors\":\"M. Kumar, C. Engelmann\",\"doi\":\"10.1109/FTXS51974.2020.00008\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Resilience plays an important role in supercomputers by providing correct and efficient operation in case of faults, errors, and failures. Resilience design patterns offer blueprints for effectively applying resilience technologies. Prior work focused on developing initial efficiency and performance models for resilience design patterns. This paper extends it by (1) describing performance, reliability, and availability models for all structural resilience design patterns, (2) providing more detailed models that include flowcharts and state diagrams, and (3) introducing the Resilience Design Pattern Modeling (RDPM) tool that calculates and plots the performance, reliability, and availability metrics of individual patterns and pattern combinations.\",\"PeriodicalId\":123780,\"journal\":{\"name\":\"2020 IEEE/ACM 10th Workshop on Fault Tolerance for HPC at eXtreme Scale (FTXS)\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE/ACM 10th Workshop on Fault Tolerance for HPC at eXtreme Scale (FTXS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/FTXS51974.2020.00008\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE/ACM 10th Workshop on Fault Tolerance for HPC at eXtreme Scale (FTXS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FTXS51974.2020.00008","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Resilience plays an important role in supercomputers by providing correct and efficient operation in case of faults, errors, and failures. Resilience design patterns offer blueprints for effectively applying resilience technologies. Prior work focused on developing initial efficiency and performance models for resilience design patterns. This paper extends it by (1) describing performance, reliability, and availability models for all structural resilience design patterns, (2) providing more detailed models that include flowcharts and state diagrams, and (3) introducing the Resilience Design Pattern Modeling (RDPM) tool that calculates and plots the performance, reliability, and availability metrics of individual patterns and pattern combinations.
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