射频干扰对集成电路电磁发射的影响

Daniel Kircher, B. Deutschmann, N. Czepl
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引用次数: 3

摘要

确保车辆安全运行的重要前提是电子系统符合电磁兼容性(EMC)要求。为确保符合适用的EMC法规,对集成电路和电子系统进行了各种各样的EMC测试,例如检查是否符合电磁发射限制或确保对干扰信号具有足够高的抗扰性。但是,在大多数情况下,这些测试是按顺序执行的,每个结果分别进行评估。通常不考虑试验程序之间可能的相互影响。在本文中,我们讨论了射频干扰如何影响IC产生的电磁发射。因此,我们提出了一种简单的测试方法,该方法基于IEC 62132的直接功率注入(DPI)表征方法和IEC 61967的150-欧姆方法。我们展示了ic的工作状态如何被干扰信号改变,从而超过电磁发射限制,并且ic不再满足功能要求。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Influence of Radio Frequency Interference on the Electromagnetic Emission of Integrated Circuits
An important prerequisite for ensuring the safe operation of vehicles is compliance of electronic systems with electromagnetic compatibility (EMC). To ensure compliance with the applicable EMC regulations, a wide variety of EMC tests, such as checking compliance with electromagnetic emission limits or ensuring a sufficiently high immunity to interference signals, are performed on integrated circuits (ICs) and electronic systems. In most cases, however, these tests are performed in sequence and each result is evaluated separately. A possible mutual influence of the test procedures is usually not taken into account. In this article, we discuss how radio frequency disturbances can affect the generated electromagnetic emission of an IC. Therefore we propose a simple test method which is based on the direct power injection (DPI) characterization method according to IEC 62132 and the 150-Ohm method according to IEC 61967. We show, how the operating state of ICs is changed by an interference signal, such that electromagnetic emission limits are exceeded and in addition the ICs do not fulfill the functional requirements anymore.
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