微处理器自动功能测试程序生成

25th ACM/IEEE, Design Automation Conference.Proceedings 1988. Pub Date : 1988-06-01 DOI:10.1109/DAC.1988.14825

Chen-Shang Lin, Hong-Fa Ho

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引用次数: 5

摘要

介绍了一种用于微处理器在用户环境下自动生成测试程序的o算法。为了消除冗余测试，采用权向图模型对通用微处理器的信号流进行建模。在图灵机模型的基础上，导出了改进的微处理器功能故障模型。然后在信号流模型和功能故障模型的基础上构造o算法。仿真结果表明，该方法的故障覆盖率优于97%。

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Automatic functional test program generation for microprocessors

An algorithm called the O-algorithm is introduced for automatic test program generation of microprocessors in a user environment. To eliminate redundant tests, a weight-digraph model is used to model the signal flow of the general microprocessors. Improved functional fault models of microprocessors are derived from the Turing machine model. The O-algorithm is then constructed on the basis of the signal flow model and functional fault models. Simulation has shown that the fault coverage is better than 97%.<>

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来源期刊

25th ACM/IEEE, Design Automation Conference.Proceedings 1988.

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