{"title":"自检微处理器的设计方法和微诊断开发","authors":"R. Parekhji, N. K. Nanda","doi":"10.1145/75362.75403","DOIUrl":null,"url":null,"abstract":"The conventional design of electronic circuits is intolerant to operational faults. Self-checking logic is aimed at online fault detection and can hence be incorporated to achieve reliable operation. In this paper, the design of a self-checking microprocessor is discussed. Self-checking strategies for different functional units are selectively and judiciously applied, and also modified wherever necessary, for the design of the register section, the arithmetic & logic unit and the control unit. A self-checking microprogrammed control unit, capable of supporting normal instruction execution concurrently with diagnostics, is developed. The design methodology has been applied to Intel's 8085A microprocessor as a case study to make it self-testing. Overheads involved have also been estimated.","PeriodicalId":365456,"journal":{"name":"MICRO 22","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Design methodology and microdiagnostics development for a self-checking microprocessor\",\"authors\":\"R. Parekhji, N. K. Nanda\",\"doi\":\"10.1145/75362.75403\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The conventional design of electronic circuits is intolerant to operational faults. Self-checking logic is aimed at online fault detection and can hence be incorporated to achieve reliable operation. In this paper, the design of a self-checking microprocessor is discussed. Self-checking strategies for different functional units are selectively and judiciously applied, and also modified wherever necessary, for the design of the register section, the arithmetic & logic unit and the control unit. A self-checking microprogrammed control unit, capable of supporting normal instruction execution concurrently with diagnostics, is developed. The design methodology has been applied to Intel's 8085A microprocessor as a case study to make it self-testing. Overheads involved have also been estimated.\",\"PeriodicalId\":365456,\"journal\":{\"name\":\"MICRO 22\",\"volume\":\"24 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"MICRO 22\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/75362.75403\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"MICRO 22","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/75362.75403","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Design methodology and microdiagnostics development for a self-checking microprocessor
The conventional design of electronic circuits is intolerant to operational faults. Self-checking logic is aimed at online fault detection and can hence be incorporated to achieve reliable operation. In this paper, the design of a self-checking microprocessor is discussed. Self-checking strategies for different functional units are selectively and judiciously applied, and also modified wherever necessary, for the design of the register section, the arithmetic & logic unit and the control unit. A self-checking microprogrammed control unit, capable of supporting normal instruction execution concurrently with diagnostics, is developed. The design methodology has been applied to Intel's 8085A microprocessor as a case study to make it self-testing. Overheads involved have also been estimated.