自检微处理器的设计方法和微诊断开发

MICRO 22 Pub Date : 1989-08-01 DOI:10.1145/75362.75403
R. Parekhji, N. K. Nanda
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引用次数: 0

摘要

传统的电子电路设计不能容忍操作故障。自检逻辑旨在在线检测故障,因此可以合并以实现可靠运行。本文讨论了一种自检微处理器的设计。对于寄存器部分、算术逻辑单元和控制单元的设计,有选择地、明智地采用不同功能单元的自检策略,并在必要时进行修改。研制了一种能同时支持正常指令执行和诊断的自检微程序控制单元。该设计方法已应用于英特尔8085A微处理器作为一个案例研究,使其自我测试。所涉及的间接费用也作了估计。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Design methodology and microdiagnostics development for a self-checking microprocessor
The conventional design of electronic circuits is intolerant to operational faults. Self-checking logic is aimed at online fault detection and can hence be incorporated to achieve reliable operation. In this paper, the design of a self-checking microprocessor is discussed. Self-checking strategies for different functional units are selectively and judiciously applied, and also modified wherever necessary, for the design of the register section, the arithmetic & logic unit and the control unit. A self-checking microprogrammed control unit, capable of supporting normal instruction execution concurrently with diagnostics, is developed. The design methodology has been applied to Intel's 8085A microprocessor as a case study to make it self-testing. Overheads involved have also been estimated.
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