{"title":"机器诊断的结构理论","authors":"C. Ramamoorthy","doi":"10.1145/1465482.1465603","DOIUrl":null,"url":null,"abstract":"The present trend in large scale integration of microelectronic technology has focussed a heavy emphasis on the maintenance and diagnostic aspects of large computers. Efficient techniques of diagnosis are important in multi-processors with reconfiguring capabilities to provide high availability. Also, a need exists for simple but effective means of understanding, visualizing and analyzing the problems associated with diagnostics. This paper presents a unified approach based on graph theory, which seems to provide a new insight into the problem without regard to the level of detail under consideration.","PeriodicalId":127219,"journal":{"name":"AFIPS '67 (Spring)","volume":"212 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1899-12-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"63","resultStr":"{\"title\":\"A structural theory of machine diagnosis\",\"authors\":\"C. Ramamoorthy\",\"doi\":\"10.1145/1465482.1465603\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The present trend in large scale integration of microelectronic technology has focussed a heavy emphasis on the maintenance and diagnostic aspects of large computers. Efficient techniques of diagnosis are important in multi-processors with reconfiguring capabilities to provide high availability. Also, a need exists for simple but effective means of understanding, visualizing and analyzing the problems associated with diagnostics. This paper presents a unified approach based on graph theory, which seems to provide a new insight into the problem without regard to the level of detail under consideration.\",\"PeriodicalId\":127219,\"journal\":{\"name\":\"AFIPS '67 (Spring)\",\"volume\":\"212 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1899-12-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"63\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"AFIPS '67 (Spring)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/1465482.1465603\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"AFIPS '67 (Spring)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/1465482.1465603","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The present trend in large scale integration of microelectronic technology has focussed a heavy emphasis on the maintenance and diagnostic aspects of large computers. Efficient techniques of diagnosis are important in multi-processors with reconfiguring capabilities to provide high availability. Also, a need exists for simple but effective means of understanding, visualizing and analyzing the problems associated with diagnostics. This paper presents a unified approach based on graph theory, which seems to provide a new insight into the problem without regard to the level of detail under consideration.