{"title":"真空热结特性的微机分析","authors":"T. Takeishi, H. Bhat, C. Minamitake","doi":"10.1109/CPEM.1988.671264","DOIUrl":null,"url":null,"abstract":"Fourier analysis technique is adopted to evaluate the dc and ac component in a thermo-electromotive force (TEMF) from a vacuo-thermojunction(VTJ) at ultra-low frequency. In experiments, a digital wavememory(DM) and a microcomputer(MC) are used to minimize a noise by repeating the analysis and averaging each results. A number of repetition required to sufficiently suppress the influence of the noise is given.","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Analysis For Vacuo-Thermojunction Characteristics Using Microcomputer\",\"authors\":\"T. Takeishi, H. Bhat, C. Minamitake\",\"doi\":\"10.1109/CPEM.1988.671264\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Fourier analysis technique is adopted to evaluate the dc and ac component in a thermo-electromotive force (TEMF) from a vacuo-thermojunction(VTJ) at ultra-low frequency. In experiments, a digital wavememory(DM) and a microcomputer(MC) are used to minimize a noise by repeating the analysis and averaging each results. A number of repetition required to sufficiently suppress the influence of the noise is given.\",\"PeriodicalId\":326579,\"journal\":{\"name\":\"1988 Conference on Precision Electromagnetic Measurements\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-06-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1988 Conference on Precision Electromagnetic Measurements\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CPEM.1988.671264\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1988 Conference on Precision Electromagnetic Measurements","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CPEM.1988.671264","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Analysis For Vacuo-Thermojunction Characteristics Using Microcomputer
Fourier analysis technique is adopted to evaluate the dc and ac component in a thermo-electromotive force (TEMF) from a vacuo-thermojunction(VTJ) at ultra-low frequency. In experiments, a digital wavememory(DM) and a microcomputer(MC) are used to minimize a noise by repeating the analysis and averaging each results. A number of repetition required to sufficiently suppress the influence of the noise is given.