{"title":"面向cad的二维Gaas效应场效应噪声模型用于Mmic设计","authors":"G. Ghione, F. Bonani, M. Pirola, C. Naldi","doi":"10.1109/APMC.1992.672186","DOIUrl":null,"url":null,"abstract":"A twtrdmensional physics-based noise model for GaAs MESFET’s is described, which can provide, on the balsis of physical and geometrical input parameters o~ily, a full frequency-dependent characterization of the noise performances. The noise model is based on the classical impedance-field method, implemented within the framework of a frequency-domain numerical drift-diffusion physical model. The paper is mainly devoted to the experimental validation of the noise model, which is performed for a re& tic caw study (a 0.6 jtm GEGMarconi MESFET). Stress is laid on the role played by the high-field diffusivity model in noise analysis, which allows a good match to be achieved between measurements and simulation for both the noise figure and the op timuni source impedance.","PeriodicalId":234490,"journal":{"name":"AMPC Asia-Pacific Microwave Conference,","volume":"235 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-08-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Cad-Oriented Physics-Based Two-Dimensional Gaas Fet Noise Model for Mmic Design\",\"authors\":\"G. Ghione, F. Bonani, M. Pirola, C. Naldi\",\"doi\":\"10.1109/APMC.1992.672186\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A twtrdmensional physics-based noise model for GaAs MESFET’s is described, which can provide, on the balsis of physical and geometrical input parameters o~ily, a full frequency-dependent characterization of the noise performances. The noise model is based on the classical impedance-field method, implemented within the framework of a frequency-domain numerical drift-diffusion physical model. The paper is mainly devoted to the experimental validation of the noise model, which is performed for a re& tic caw study (a 0.6 jtm GEGMarconi MESFET). Stress is laid on the role played by the high-field diffusivity model in noise analysis, which allows a good match to be achieved between measurements and simulation for both the noise figure and the op timuni source impedance.\",\"PeriodicalId\":234490,\"journal\":{\"name\":\"AMPC Asia-Pacific Microwave Conference,\",\"volume\":\"235 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-08-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"AMPC Asia-Pacific Microwave Conference,\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/APMC.1992.672186\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"AMPC Asia-Pacific Microwave Conference,","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APMC.1992.672186","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Cad-Oriented Physics-Based Two-Dimensional Gaas Fet Noise Model for Mmic Design
A twtrdmensional physics-based noise model for GaAs MESFET’s is described, which can provide, on the balsis of physical and geometrical input parameters o~ily, a full frequency-dependent characterization of the noise performances. The noise model is based on the classical impedance-field method, implemented within the framework of a frequency-domain numerical drift-diffusion physical model. The paper is mainly devoted to the experimental validation of the noise model, which is performed for a re& tic caw study (a 0.6 jtm GEGMarconi MESFET). Stress is laid on the role played by the high-field diffusivity model in noise analysis, which allows a good match to be achieved between measurements and simulation for both the noise figure and the op timuni source impedance.