现代电力电子技术引起的脉冲电压应力对机器绕组绝缘材料影响的估计

A. Qerkini, M. Vogelsberger, P. Macheiner, W. Grubelnik, H. Ertl, T. Wolbank
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引用次数: 2

摘要

现代电力驱动通常由电压源逆变器驱动。为了减小尺寸和损耗,现代电力电子器件的开关速度不断提高。同时,可以观察到,由于额外的应力,在重复的快速电压转换下运行会降低电机绝缘的可靠性和寿命。绝缘材料中允许电压脉冲应力的可用数据通常限于上升时间低于300ns和dv/dt低于几kV/µs的电压脉冲。随着宽带隙电力电子器件的引入,dv/dt将显著增加,留下了对由此产生的绝缘寿命影响的问题。本文介绍了在类似中压SiC技术的工作条件下的绝缘寿命试验。确定了材料内部的可逆和不可逆效应,并显示了它们与开关速度和脉冲电压大小的关系。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Estimating the Impact of Pulse Voltage Stress Caused by Modern Power Electronics Technology on Machine Winding Insulation Material
Modern electric drives are generally driven by voltage source inverters. With the aim of reducing size and losses, switching speed of modern power electronic devices is steadily increasing. At the same time, it can be observed that operation under repetitive fast voltage transitions is reducing reliability and lifetime of motor insulation due to the additional stress. Available data for allowable voltage pulse stress in insulation material is usually limited to voltage pulses having rise time below 300ns and dv/dt below several kV/µs. With the introduction of wide bandgap power electronic devices, dv/dt will be significantly increased leaving the question about the impact on resulting insulation life time. In this paper insulation life time tests are presented under operating conditions similar to medium voltage SiC technology. Reversible and irreversible effects within the material are identified and their connection to switching speed and pulse voltage magnitude shown.
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