{"title":"高压直流输电系统晶闸管阀的最新技术进展","authors":"S. Tanabe, S. Irokawa","doi":"10.1109/EMPD.1995.500759","DOIUrl":null,"url":null,"abstract":"Thyristor valves have progressed with an increasing thyristor capacity. Over the past 15 years the volume of a thyristor valve has reduced to about one-third and power loss to about one-half. The advance of thyristor valves, however, seems to have reached a saturation level if simply an increase in the thyristor capacity continues to be sought. To increase the dielectric strength of thyristors requires increasing the silicon wafer thickness and resistivity. Increased thickness and resistivity of silicon wafer, however, increase conduction loss of a thyristor valve. The conduction loss can be reduced by prolonging the carrier life-time of silicon wafer, which in turn increases the loss of a damping circuit. For improving such a tradeoff relationship, an ion irradiation technology was developed. It is shown that optimization of thyristor characteristics is important in optimizing the thyristor valve.","PeriodicalId":447674,"journal":{"name":"Proceedings 1995 International Conference on Energy Management and Power Delivery EMPD '95","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-11-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Recent technical advancement of thyristor valve for HVDC transmission system\",\"authors\":\"S. Tanabe, S. Irokawa\",\"doi\":\"10.1109/EMPD.1995.500759\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Thyristor valves have progressed with an increasing thyristor capacity. Over the past 15 years the volume of a thyristor valve has reduced to about one-third and power loss to about one-half. The advance of thyristor valves, however, seems to have reached a saturation level if simply an increase in the thyristor capacity continues to be sought. To increase the dielectric strength of thyristors requires increasing the silicon wafer thickness and resistivity. Increased thickness and resistivity of silicon wafer, however, increase conduction loss of a thyristor valve. The conduction loss can be reduced by prolonging the carrier life-time of silicon wafer, which in turn increases the loss of a damping circuit. For improving such a tradeoff relationship, an ion irradiation technology was developed. It is shown that optimization of thyristor characteristics is important in optimizing the thyristor valve.\",\"PeriodicalId\":447674,\"journal\":{\"name\":\"Proceedings 1995 International Conference on Energy Management and Power Delivery EMPD '95\",\"volume\":\"4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-11-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 1995 International Conference on Energy Management and Power Delivery EMPD '95\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMPD.1995.500759\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 1995 International Conference on Energy Management and Power Delivery EMPD '95","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMPD.1995.500759","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Recent technical advancement of thyristor valve for HVDC transmission system
Thyristor valves have progressed with an increasing thyristor capacity. Over the past 15 years the volume of a thyristor valve has reduced to about one-third and power loss to about one-half. The advance of thyristor valves, however, seems to have reached a saturation level if simply an increase in the thyristor capacity continues to be sought. To increase the dielectric strength of thyristors requires increasing the silicon wafer thickness and resistivity. Increased thickness and resistivity of silicon wafer, however, increase conduction loss of a thyristor valve. The conduction loss can be reduced by prolonging the carrier life-time of silicon wafer, which in turn increases the loss of a damping circuit. For improving such a tradeoff relationship, an ion irradiation technology was developed. It is shown that optimization of thyristor characteristics is important in optimizing the thyristor valve.