{"title":"运放电路解调RFI预测对模型参数值变化的敏感性","authors":"Y. Sutu, J. Whalen","doi":"10.1109/ISEMC.1985.7566975","DOIUrl":null,"url":null,"abstract":"The computer program NCAP has been used to predict demodulation RFI effects in operational amplifier (op amp) circuits excited by 50% AM-modulated RF signals over the RF frequency range 0.1 to 400 MHz. The op amp circuit investigated is a unity gain buffer amplifier with 741 bipolar or LF355 JFET—bipolar op amps. The sensitivity of the RFI demodulation predictions to variations in model parameter values has been determined.","PeriodicalId":256770,"journal":{"name":"1985 IEEE International Symposium on Electromagnetic Compatibility","volume":"9 12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1985-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"The Sensitivity of Demodulation RFI Predictions in Op Amp Circuits to Variations in Model Parameter Values\",\"authors\":\"Y. Sutu, J. Whalen\",\"doi\":\"10.1109/ISEMC.1985.7566975\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The computer program NCAP has been used to predict demodulation RFI effects in operational amplifier (op amp) circuits excited by 50% AM-modulated RF signals over the RF frequency range 0.1 to 400 MHz. The op amp circuit investigated is a unity gain buffer amplifier with 741 bipolar or LF355 JFET—bipolar op amps. The sensitivity of the RFI demodulation predictions to variations in model parameter values has been determined.\",\"PeriodicalId\":256770,\"journal\":{\"name\":\"1985 IEEE International Symposium on Electromagnetic Compatibility\",\"volume\":\"9 12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1985-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1985 IEEE International Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1985.7566975\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1985 IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1985.7566975","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The Sensitivity of Demodulation RFI Predictions in Op Amp Circuits to Variations in Model Parameter Values
The computer program NCAP has been used to predict demodulation RFI effects in operational amplifier (op amp) circuits excited by 50% AM-modulated RF signals over the RF frequency range 0.1 to 400 MHz. The op amp circuit investigated is a unity gain buffer amplifier with 741 bipolar or LF355 JFET—bipolar op amps. The sensitivity of the RFI demodulation predictions to variations in model parameter values has been determined.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
