{"title":"自由空间散射测量的精度:随机误差和系统误差","authors":"C. Eyraud, J. Geffrin, P. Sabouroux","doi":"10.1109/ANTEM.2005.7852069","DOIUrl":null,"url":null,"abstract":"The possibilities of 2D and 3D target scattering measurements have already been validated in the anechoic chamber of the C.C.R.M. The current purpose is to increase the complexity of the studied objects, which requires an improvement of the measurement accuracy.","PeriodicalId":360668,"journal":{"name":"11th International Symposium on Antenna Technology and Applied Electromagnetics [ANTEM 2005]","volume":"65 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"On the accuracy of scattering measurements in free space: Random and systematic errors\",\"authors\":\"C. Eyraud, J. Geffrin, P. Sabouroux\",\"doi\":\"10.1109/ANTEM.2005.7852069\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The possibilities of 2D and 3D target scattering measurements have already been validated in the anechoic chamber of the C.C.R.M. The current purpose is to increase the complexity of the studied objects, which requires an improvement of the measurement accuracy.\",\"PeriodicalId\":360668,\"journal\":{\"name\":\"11th International Symposium on Antenna Technology and Applied Electromagnetics [ANTEM 2005]\",\"volume\":\"65 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"11th International Symposium on Antenna Technology and Applied Electromagnetics [ANTEM 2005]\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ANTEM.2005.7852069\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"11th International Symposium on Antenna Technology and Applied Electromagnetics [ANTEM 2005]","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ANTEM.2005.7852069","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
On the accuracy of scattering measurements in free space: Random and systematic errors
The possibilities of 2D and 3D target scattering measurements have already been validated in the anechoic chamber of the C.C.R.M. The current purpose is to increase the complexity of the studied objects, which requires an improvement of the measurement accuracy.