敏捷FAB的晶圆环境控制

S. Ito, M. Tamaoki, A. Shimazaki, S. Nadahara, K. Okumura, Y. Suzuki, A. Tanaka, M. Tsujimura
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引用次数: 4

摘要

“晶圆环境控制箱”的开发是为了尽量减少化学污染物的影响,如酸性气体、碱性气体、有机分子和湿度。它由ULPA过滤器、化学过滤器、SPE膜(除湿机)和风扇组成。我们将Box应用于Al互连过程。酸性气体吸附在晶圆片上导致腐蚀缺陷。通过将晶圆片保持在“晶圆环境控制箱”中,由于化学过滤器捕获了从晶圆片中解吸的酸性气体,因此防止了铝管线的腐蚀。我们还将湿度控制的方法应用于多晶硅塞工艺。多晶硅/硅接触电阻与连续加工的接触电阻相当,即使在多晶硅沉积前保持67 h。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Wafer ambient control for Agile FAB
The "Wafer Ambient Control Box" has been developed for minimizing the influence of chemical contaminants such as acidic gas, basic gas, organic molecules, and also humidity. It consists of a ULPA filter, chemical filters, SPE films (dehumidifier), and a fan. We applied the Box to the Al interconnection process. The acidic gas adsorbed on the wafer causes corrosion defects. By keeping the wafer in the "Wafer Ambient Control Box", Al lines were prevented from corrosion because the chemical filter trapped the acidic gas desorbed from the wafer. We also applied the humidity controlled one to the poly-Si plug process. The poly-Si/Si contact resistance was equivalent to that processed continuously even though it was kept for 67 h before poly-Si deposition.
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