量子级电路/器件建模

Zhiping Yu, R. Dutton, R. Kiehl
{"title":"量子级电路/器件建模","authors":"Zhiping Yu, R. Dutton, R. Kiehl","doi":"10.1109/IWCE.1998.742752","DOIUrl":null,"url":null,"abstract":"Quantum mechanical (QM) effects, which manifest when the device dimensions are comparable to the de Broglie wavelength, are becoming common physical phenomena in the current micro-/nano-meter technology era. While most novel devices take advantage of QM effects to achieve fast switching speed, miniature size, and extremely small power consumption, the mainstream CMOS devices (with the exception of EEPROMs) are generally suffering in performance from these effects. Solutions to minimize the adverse effects caused by QM while keeping the down scaling trend (technology feasibility aside) are being sought in the research community and industry-wide. This talk tries to present a perspective view of modeling approaches to quantum mechanical effects in solid-state devices at the device and circuit simulation levels. Specifically, the macroscopic modeling of silicon devices to include QM corrections in the classical transport framework is discussed. Both device and circuit models are provided. On the quantum devices, such as the single electron junctions and transistors, the emphasis is placed on the principle of logic circuit operation.","PeriodicalId":357304,"journal":{"name":"1998 Sixth International Workshop on Computational Electronics. Extended Abstracts (Cat. No.98EX116)","volume":"48 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"61","resultStr":"{\"title\":\"Circuit/device modeling at the quantum level\",\"authors\":\"Zhiping Yu, R. Dutton, R. Kiehl\",\"doi\":\"10.1109/IWCE.1998.742752\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Quantum mechanical (QM) effects, which manifest when the device dimensions are comparable to the de Broglie wavelength, are becoming common physical phenomena in the current micro-/nano-meter technology era. While most novel devices take advantage of QM effects to achieve fast switching speed, miniature size, and extremely small power consumption, the mainstream CMOS devices (with the exception of EEPROMs) are generally suffering in performance from these effects. Solutions to minimize the adverse effects caused by QM while keeping the down scaling trend (technology feasibility aside) are being sought in the research community and industry-wide. This talk tries to present a perspective view of modeling approaches to quantum mechanical effects in solid-state devices at the device and circuit simulation levels. Specifically, the macroscopic modeling of silicon devices to include QM corrections in the classical transport framework is discussed. Both device and circuit models are provided. On the quantum devices, such as the single electron junctions and transistors, the emphasis is placed on the principle of logic circuit operation.\",\"PeriodicalId\":357304,\"journal\":{\"name\":\"1998 Sixth International Workshop on Computational Electronics. Extended Abstracts (Cat. No.98EX116)\",\"volume\":\"48 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"61\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1998 Sixth International Workshop on Computational Electronics. Extended Abstracts (Cat. No.98EX116)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IWCE.1998.742752\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1998 Sixth International Workshop on Computational Electronics. Extended Abstracts (Cat. No.98EX116)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IWCE.1998.742752","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 61

摘要

在当前的微纳米技术时代,当器件尺寸与德布罗意波长相当时,量子力学效应(QM)就会显现出来,这是一种常见的物理现象。虽然大多数新型器件利用QM效应来实现快速开关速度、微型尺寸和极低的功耗,但主流CMOS器件(eeprom除外)的性能通常受到这些效应的影响。研究团体和整个行业都在寻求解决方案,以最大限度地减少QM造成的不利影响,同时保持缩小规模的趋势(技术可行性除外)。本演讲试图从器件和电路仿真的角度,展示固态器件中量子力学效应的建模方法。具体来说,讨论了硅器件的宏观建模,以在经典输运框架中包含QM修正。提供了器件和电路模型。在单电子结和晶体管等量子器件上,重点是逻辑电路的工作原理。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Circuit/device modeling at the quantum level
Quantum mechanical (QM) effects, which manifest when the device dimensions are comparable to the de Broglie wavelength, are becoming common physical phenomena in the current micro-/nano-meter technology era. While most novel devices take advantage of QM effects to achieve fast switching speed, miniature size, and extremely small power consumption, the mainstream CMOS devices (with the exception of EEPROMs) are generally suffering in performance from these effects. Solutions to minimize the adverse effects caused by QM while keeping the down scaling trend (technology feasibility aside) are being sought in the research community and industry-wide. This talk tries to present a perspective view of modeling approaches to quantum mechanical effects in solid-state devices at the device and circuit simulation levels. Specifically, the macroscopic modeling of silicon devices to include QM corrections in the classical transport framework is discussed. Both device and circuit models are provided. On the quantum devices, such as the single electron junctions and transistors, the emphasis is placed on the principle of logic circuit operation.
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