在IP验证中导致受控随机化的方法/方法

Meghashyam Ashwathanarayan, G. Jayakrishna
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引用次数: 1

摘要

硅后验证是在硅交付给客户之前对其进行检查的最后一个阶段。汽车微控制器在安全关键应用中广泛使用直接存储器访问(DMA)。本文解释了如何改进后硅验证,以满足具有大量知识产权(IP)的微控制器日益复杂的需求。随着设计复杂性的增加、规模的扩大和上市时间的缩短,测试微控制器的稳健性势在必行。传统的测试用例遵循直接的测试方法,并不能保证完整的功能覆盖。所提出的方法使用了基于约束的随机化概念,该概念用于预硅验证。在后硅验证中使用基于约束的随机化的主要优点是可以在很短的时间内执行数百万个种子。这也强调了硅,增加了发现错误的可能性,而在硅之前的阶段,人类是不可能发现错误的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A method/approach leading to controlled randomization in validation of an IP
Post-silicon validation is the last level of inspecting the silicon before it is delivered to the customer. Automotive microcontrollers use Direct Memory Access (DMA) extensively in safety critical applications. This article explains how post-silicon validation can be improved to address the needs of the growing complexity of microcontrollers with a large number of Intellectual Property (IP). With increasing design complexity, aggressive scaling, and decreasing time to market, it is imperative to test the robustness of the microcontroller. Traditional test cases follow directed approach to testing and do not guarantee complete functional coverage. The proposed methodology uses the concept of constraint based randomization that is used in pre-silicon verification. The main advantage of using constraint based randomization in post-silicon validation is that millions of seeds can be executed in a very short time. This also stresses the silicon, increasing the likelihood of uncovering a bug which would not have been humanly possible to uncover at the pre-silicon stage.
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