G. Torregrosa-Penalva, A. Asensio-López, A. Blanco-del-Campo, J. Fernández-González
{"title":"微波功率场效应管直流模型的等温非脉冲测量提取","authors":"G. Torregrosa-Penalva, A. Asensio-López, A. Blanco-del-Campo, J. Fernández-González","doi":"10.1109/EMICC.2006.282651","DOIUrl":null,"url":null,"abstract":"In this work a new approach to extract the experimental fitting parameters of a microwave power FET temperature dependent DC-model is presented. The suggested procedure avoids the possibility of multiple model solutions by eliminating the measurements temperature dependence. This is accomplished by making use of isothermal measurements which in turn are obtained following a simple non-pulsed approach. The proposed technique was applied to a commercial X band MMIC FET power amplifier","PeriodicalId":269652,"journal":{"name":"2006 European Microwave Integrated Circuits Conference","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2006-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Microwave Power FET DC Model Extraction through Isothermal Non-Pulsed Measurements\",\"authors\":\"G. Torregrosa-Penalva, A. Asensio-López, A. Blanco-del-Campo, J. Fernández-González\",\"doi\":\"10.1109/EMICC.2006.282651\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this work a new approach to extract the experimental fitting parameters of a microwave power FET temperature dependent DC-model is presented. The suggested procedure avoids the possibility of multiple model solutions by eliminating the measurements temperature dependence. This is accomplished by making use of isothermal measurements which in turn are obtained following a simple non-pulsed approach. The proposed technique was applied to a commercial X band MMIC FET power amplifier\",\"PeriodicalId\":269652,\"journal\":{\"name\":\"2006 European Microwave Integrated Circuits Conference\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 European Microwave Integrated Circuits Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMICC.2006.282651\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 European Microwave Integrated Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMICC.2006.282651","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Microwave Power FET DC Model Extraction through Isothermal Non-Pulsed Measurements
In this work a new approach to extract the experimental fitting parameters of a microwave power FET temperature dependent DC-model is presented. The suggested procedure avoids the possibility of multiple model solutions by eliminating the measurements temperature dependence. This is accomplished by making use of isothermal measurements which in turn are obtained following a simple non-pulsed approach. The proposed technique was applied to a commercial X band MMIC FET power amplifier
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
