基于快速投影的电路电平验证方法

Chao Yan, M. Greenstreet
{"title":"基于快速投影的电路电平验证方法","authors":"Chao Yan, M. Greenstreet","doi":"10.1109/ASPDAC.2008.4483985","DOIUrl":null,"url":null,"abstract":"As VLSI fabrication technology progresses to 65 nm feature sizes and smaller, transistors no longer operate as ideal switches. This motivates the verification of digital circuits using continuous models. Recently, we showed how such verification can be performed using projection based methods.However, the verification was slow, requiring nearly four CPU days to verify a nine-transistor toggle flip-flop. Here, we describe improvements to the reachability algorithms and optimizations of the software architecture. These produce a 15 x reduction in computation time and significant reductions in the overapproximation errors. With these changes, the same toggle flip-flop can be verified in a few hours, making formal verification a viable alternative to circuit simulation.","PeriodicalId":277556,"journal":{"name":"2008 Asia and South Pacific Design Automation Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-01-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":"{\"title\":\"Faster projection based methods for circuit level verification\",\"authors\":\"Chao Yan, M. Greenstreet\",\"doi\":\"10.1109/ASPDAC.2008.4483985\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"As VLSI fabrication technology progresses to 65 nm feature sizes and smaller, transistors no longer operate as ideal switches. This motivates the verification of digital circuits using continuous models. Recently, we showed how such verification can be performed using projection based methods.However, the verification was slow, requiring nearly four CPU days to verify a nine-transistor toggle flip-flop. Here, we describe improvements to the reachability algorithms and optimizations of the software architecture. These produce a 15 x reduction in computation time and significant reductions in the overapproximation errors. With these changes, the same toggle flip-flop can be verified in a few hours, making formal verification a viable alternative to circuit simulation.\",\"PeriodicalId\":277556,\"journal\":{\"name\":\"2008 Asia and South Pacific Design Automation Conference\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-01-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"13\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 Asia and South Pacific Design Automation Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASPDAC.2008.4483985\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 Asia and South Pacific Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASPDAC.2008.4483985","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 13

摘要

随着VLSI制造技术发展到65nm及更小的特征尺寸,晶体管不再是理想的开关。这激发了使用连续模型验证数字电路的动机。最近,我们展示了如何使用基于投影的方法来执行这样的验证。然而,验证是缓慢的,需要近4个CPU天来验证一个9晶体管的开关触发器。在这里,我们描述了可达性算法的改进和软件架构的优化。这使计算时间减少了15倍,并大大减少了过度近似误差。通过这些更改,可以在几个小时内验证相同的开关触发器,使正式验证成为电路仿真的可行替代方案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Faster projection based methods for circuit level verification
As VLSI fabrication technology progresses to 65 nm feature sizes and smaller, transistors no longer operate as ideal switches. This motivates the verification of digital circuits using continuous models. Recently, we showed how such verification can be performed using projection based methods.However, the verification was slow, requiring nearly four CPU days to verify a nine-transistor toggle flip-flop. Here, we describe improvements to the reachability algorithms and optimizations of the software architecture. These produce a 15 x reduction in computation time and significant reductions in the overapproximation errors. With these changes, the same toggle flip-flop can be verified in a few hours, making formal verification a viable alternative to circuit simulation.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信