一种用于测试和低功耗的状态分配技术

Proceedings. 41st Design Automation Conference, 2004. Pub Date : 2004-06-07 DOI:10.1145/996566.996707

Sungju Park, Sangwook Cho, Seiyang Yang, M. Ciesielski

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引用次数: 17

摘要

为了提高系统的可测试性和功耗，本文提出了一种基于m块划分的状态分配技术。反馈周期的长度和数量减少，状态变量上的切换活动最小。实验表明，基准电路的功耗和可测试性得到了显著改善。

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A now state assignment technique for testing and low power

In order to improve the testabilities and power consumption, a new state assignment technique based on m-block partition is introduced in this paper. The length and number of feedback cycles are reduced with minimal switching activity on the state variables. Experiment shows significant improvement in power dissipation and testabilities for benchmark circuits.

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来源期刊

Proceedings. 41st Design Automation Conference, 2004.

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