指导委员会

{"title":"指导委员会","authors":"R. Buyya, A. Sill, O. Rana, A. Anjum, Xinghui Zhao","doi":"10.1109/dcoss.2019.00007","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":301814,"journal":{"name":"2020 IEEE 20th International Conference on Software Quality, Reliability and Security (QRS)","volume":"198 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Steering Committee\",\"authors\":\"R. Buyya, A. Sill, O. Rana, A. Anjum, Xinghui Zhao\",\"doi\":\"10.1109/dcoss.2019.00007\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":301814,\"journal\":{\"name\":\"2020 IEEE 20th International Conference on Software Quality, Reliability and Security (QRS)\",\"volume\":\"198 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE 20th International Conference on Software Quality, Reliability and Security (QRS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/dcoss.2019.00007\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 20th International Conference on Software Quality, Reliability and Security (QRS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/dcoss.2019.00007","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}