随机可测试顺序电路的设计

[1989] The Nineteenth International Symposium on Fault-Tolerant Computing. Digest of Papers Pub Date : 1989-06-21 DOI:10.1109/FTCS.1989.105552

H. Wunderlich

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引用次数: 38

摘要

描述了一种用于选择直接可访问的人字拖的最小集合的方法。由于这个问题是np完全的，所以可以使用一些启发式方法推导出次优解。提出了一种算法来计算模式的相应权值，在某些情况下，模式是时变的。通过实例对整个方法进行了验证。只需将10-40%的触发器集成到部分扫描路径或内置自检寄存器中，就可以通过加权随机模式获得几乎完全的故障覆盖

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The design of random-testable sequential circuits

A method is described for selecting a minimal set of directly accessible flip-flops. Since this problem turns out to be NP-complete, suboptimal solutions can be derived using some heuristics. An algorithm is presented to compute the corresponding weights of the patterns, which are time-dependent in some cases. The entire approach is validated with the help of examples. Only 10-40% of the flip-flops have to be integrated into a partial scan path or into a built-in self-test register to obtain nearly complete fault coverage by weighted random patterns.<>

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来源期刊

[1989] The Nineteenth International Symposium on Fault-Tolerant Computing. Digest of Papers

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