基于自组织映射的ICmetrics特征分析算法

X. Zhai, Kofi Appiah, Shoaib Ehsan, Wah M. Cheung, Huosheng Hu, Dongbing Gu, K. Mcdonald-Maier, G. Howells
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引用次数: 1

摘要

ICmetrics是一种利用嵌入式系统的特性和行为来获得一系列属性和特征的新方法,其目的是基于其自身的行为身份来唯一地识别和保护嵌入式系统。本文提出了一种基于自组织映射(SOM)神经网络的算法,用于提取和分析处理器性能特征(即每指令平均周期(CPI)),其中提取的特征用于帮助找到系统的主要行为。该算法已在MiBench基准测试套件中选择了不同的程序进行测试,结果表明,它可以根据提取的独特特征成功地将每个程序划分为不同的主要阶段,这证实了它在ICmetrics技术中的实用性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Self-Organising Map Based Algorithm for Analysis of ICmetrics Features
ICmetrics is a new approach that exploits the characteristic and behaviour of an embedded system to obtain a collection of properties and features, which aims to uniquely identify and secure an embedded system based on its own behavioural identity. In this paper, an algorithm based on a self-organising map (SOM) neural network is proposed to extract and analyse the features derived from a processor's performance profile (i.e. average cycles per instruction (CPI)), where the extracted features are used to help finding the main behaviours of the system. The proposed algorithm has been tested with different programs selected from the MiBench benchmark suite, and the results achieved show that it can successfully segment each program into different main phases based on the unique extracted features, which confirms its utility for the ICmetrics technology.
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