{"title":"用于同步获取三维几何和表面反射率的同轴光学扫描仪","authors":"M. Holroyd, Jason Lawrence, Todd E. Zickler","doi":"10.1145/1833349.1778836","DOIUrl":null,"url":null,"abstract":"We present a novel optical setup and processing pipeline for measuring the 3D geometry and spatially-varying surface reflectance of physical objects. Central to our design is a digital camera and a high frequency spatially-modulated light source aligned to share a common focal point and optical axis. Pairs of such devices allow capturing a sequence of images from which precise measurements of geometry and reflectance can be recovered. Our approach is enabled by two technical contributions: a new active multiview stereo algorithm and an analysis of light descattering that has important implications for image-based reflectometry. We show that the geometry measured by our scanner is accurate to within 50 microns at a resolution of roughly 200 microns and that the reflectance agrees with reference data to within 5.5%. Additionally, we present an image relighting application and show renderings that agree very well with reference images at light and view positions far from those that were initially measured.","PeriodicalId":132490,"journal":{"name":"ACM SIGGRAPH 2010 papers","volume":"65 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-07-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"134","resultStr":"{\"title\":\"A coaxial optical scanner for synchronous acquisition of 3D geometry and surface reflectance\",\"authors\":\"M. Holroyd, Jason Lawrence, Todd E. Zickler\",\"doi\":\"10.1145/1833349.1778836\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present a novel optical setup and processing pipeline for measuring the 3D geometry and spatially-varying surface reflectance of physical objects. Central to our design is a digital camera and a high frequency spatially-modulated light source aligned to share a common focal point and optical axis. Pairs of such devices allow capturing a sequence of images from which precise measurements of geometry and reflectance can be recovered. Our approach is enabled by two technical contributions: a new active multiview stereo algorithm and an analysis of light descattering that has important implications for image-based reflectometry. We show that the geometry measured by our scanner is accurate to within 50 microns at a resolution of roughly 200 microns and that the reflectance agrees with reference data to within 5.5%. Additionally, we present an image relighting application and show renderings that agree very well with reference images at light and view positions far from those that were initially measured.\",\"PeriodicalId\":132490,\"journal\":{\"name\":\"ACM SIGGRAPH 2010 papers\",\"volume\":\"65 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-07-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"134\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ACM SIGGRAPH 2010 papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/1833349.1778836\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACM SIGGRAPH 2010 papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/1833349.1778836","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A coaxial optical scanner for synchronous acquisition of 3D geometry and surface reflectance
We present a novel optical setup and processing pipeline for measuring the 3D geometry and spatially-varying surface reflectance of physical objects. Central to our design is a digital camera and a high frequency spatially-modulated light source aligned to share a common focal point and optical axis. Pairs of such devices allow capturing a sequence of images from which precise measurements of geometry and reflectance can be recovered. Our approach is enabled by two technical contributions: a new active multiview stereo algorithm and an analysis of light descattering that has important implications for image-based reflectometry. We show that the geometry measured by our scanner is accurate to within 50 microns at a resolution of roughly 200 microns and that the reflectance agrees with reference data to within 5.5%. Additionally, we present an image relighting application and show renderings that agree very well with reference images at light and view positions far from those that were initially measured.