真空断路器用Cu-Cr触头材料的现状及发展趋势

XXIst International Symposium on Discharges and Electrical Insulation in Vacuum, 2004. Proceedings. ISDEIV. Pub Date : 1900-01-01 DOI:10.1109/DEIV.2004.1422608

B. Miao, Yan Zhang, Guoxun Liu

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引用次数: 20

摘要

本文对中压大电流真空断路器触头广泛采用的Cu-Cr材料进行了综述。结果表明，微观结构是接触材料加工与性能之间的战略纽带，也是Cn-Cr合金接触材料质量和性能优于CuCr p/m接触材料的原因。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Current status and developing trends of Cu-Cr contact materials for VCB

This paper briefly reviews the Cu-Cr materials which are widely adopted for contacts in medium-voltage, high current vacuum circuit breakers (VCB). It is shown that microstructure is a strategic link between the processing and properties of the contact materials, and why the quality and performance of Cn-Cr alloy contact materials are superior to that of CuCr p/m contact materials.

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来源期刊

XXIst International Symposium on Discharges and Electrical Insulation in Vacuum, 2004. Proceedings. ISDEIV.

CiteScore

0.40

自引率

0.00%

发文量