用于检测需求和规范缺陷的单元引理

2020 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW) Pub Date : 2020-10-01 DOI:10.1109/ISSREW51248.2020.00063

A. Hocking, Jonathan C. Rowanhill, B. D. Vito

{"title":"用于检测需求和规范缺陷的单元引理","authors":"A. Hocking, Jonathan C. Rowanhill, B. D. Vito","doi":"10.1109/ISSREW51248.2020.00063","DOIUrl":null,"url":null,"abstract":"Unit lemmas and a checklist of questions used to generate them can identify flaws in formal requirements and specifications early in the design process, reducing the overall cost and increasing confidence in the final product. We demonstrate how we can apply unit lemmas and the checklist to a tri-valued logic system.","PeriodicalId":202247,"journal":{"name":"2020 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)","volume":"58 4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Unit Lemmas for Detecting Requirement and Specification Flaws\",\"authors\":\"A. Hocking, Jonathan C. Rowanhill, B. D. Vito\",\"doi\":\"10.1109/ISSREW51248.2020.00063\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Unit lemmas and a checklist of questions used to generate them can identify flaws in formal requirements and specifications early in the design process, reducing the overall cost and increasing confidence in the final product. We demonstrate how we can apply unit lemmas and the checklist to a tri-valued logic system.\",\"PeriodicalId\":202247,\"journal\":{\"name\":\"2020 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)\",\"volume\":\"58 4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSREW51248.2020.00063\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSREW51248.2020.00063","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

单元引理和用于生成它们的问题清单可以在设计过程的早期识别正式需求和规范中的缺陷，从而降低总体成本并增加对最终产品的信心。我们演示了如何将单元引理和检查表应用于三值逻辑系统。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Unit Lemmas for Detecting Requirement and Specification Flaws

Unit lemmas and a checklist of questions used to generate them can identify flaws in formal requirements and specifications early in the design process, reducing the overall cost and increasing confidence in the final product. We demonstrate how we can apply unit lemmas and the checklist to a tri-valued logic system.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2020 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)

自引率

0.00%

发文量