通过脑电图和机器学习分析ASD与脑活动的时间关系

Yasith Jayawardana, M. Jaime, S. Jayarathna
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引用次数: 17

摘要

自闭症谱系障碍(ASD)是一种损害正常社会认知和交流功能的神经发育障碍。早期诊断对于ASD的及时有效治疗至关重要。自闭症诊断观察表第二版(ADOS-2)是目前诊断ASD的黄金标准。在本文中,我们通过使用ADOS-2治疗期间的脑电图(EEG)数据分析了ASD与大脑活动之间的短期和长期关系。这些读数来自8名被诊断为ASD的儿童和9名低风险对照组。我们通过频带分解和相对于基线的小波变换得出每个电极的功率谱,并生成两组分别捕获长期和短期趋势的训练数据。我们利用机器学习模型来预测ASD诊断和ADOS-2评分,这为这种趋势的存在提供了一个估计。在评估短期依赖关系时,我们通过线性模型获得了最高56%的分类准确率。非线性模型提供了92%以上的分类准确率,并在RMSE为4的范围内预测了ADOS-2分数。我们使用CNN模型来评估长期趋势,并获得了90%以上的分类准确率。我们的研究结果对使用脑电图作为ASD的非侵入性生物标志物具有重要意义,并且具有最小的特征操作和计算开销。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Analysis of Temporal Relationships between ASD and Brain Activity through EEG and Machine Learning
Autism Spectrum Disorder (ASD) is a neurodevelopmental disorder that impairs normative social cognitive and communicative function. Early diagnosis is crucial for the timely and efficacious treatment of ASD. The Autism Diagnostic Observation Schedule Second Edition (ADOS-2) is the current gold standard for diagnosing ASD. In this paper, we analyse the short-term and long-term relationships between ASD and brain activity using Electroencephalography (EEG) readings taken during the administration of ADOS-2. These readings were collected from 8 children diagnosed with ASD, and 9 low risk controls. We derive power spectrums for each electrode through frequency band decomposition and through wavelet transforms relative to a baseline, and generate two sets of training data that captures long-term and short-term trends respectively. We utilize machine learning models to predict the ASD diagnosis and the ADOS-2 scores, which provide an estimate for the presence of such trends. When evaluating short-term dependencies, we obtain a maximum of 56% accuracy of classification through linear models. Non-linear models provide a classification above 92% accuracy, and predicted ADOS-2 scores within an RMSE of 4. We use a CNN model to evaluate the long-term trends, and obtain a classification accuracy above 90%. Our findings have implications for using EEG as a non-invasive bio-marker for ASD with minimal feature manipulation and computational overhead.
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