硬件控制和软件独立的FPGA容错体系结构

N. Goel, K. Paul
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引用次数: 8

摘要

随着制造工艺复杂性的增加,在深亚微米工艺下芯片的成品率下降。在未来的先进制造技术中,容错技术将是提高超大规模集成电路芯片成品率的重要技术。在像FPGA这样的常规结构中,冗余通常用于容错。到目前为止,在文献中发现的大多数技术都是关于基于软件的配置数据更改。在这项工作中,我们提出了一种解决方案,其中FPGA的配置位流由存在于芯片本身的硬件控制器修改。该技术使用冗余柱来替换有缺陷的细胞。使用VPR工具在不同电路上进行的实验表明,由于我们的方法,关键路径延迟平均增加2.6%,而每个单元的面积没有增加。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Hardware Controlled and Software Independent Fault Tolerant FPGA Architecture
With the increase in complexity of fabrication techniques, yield of the chip production decreases at deep sub-micron technologies. In future fault tolerant techniques will be important to increase the yield of the VLSI chips in advanced fabrication technologies. In regular structure like FPGA, redundancy is commonly used for fault tolerance. Most of the techniques found so far in literature talk about software based changes in the configuration data. In this work we present a solution in which configuration bit stream of FPGA is modified by a hardware controller that is present on the chip itself. The technique uses redundant columns for replacing faulty cells. Experiments on different circuits using VPR tool shows that there is an average 2.6% increase in the critical path delay while no increase in the area per cell due to our approach.
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