{"title":"可靠的高速缓存和控制存储器设计","authors":"R. Horst","doi":"10.1109/FTCS.1989.105576","DOIUrl":null,"url":null,"abstract":"The design of the cache and control store memories of the Tandem NonStop VLX processor is discussed. Service costs are reduced by using hot-standby sparing to improve the reliability of the large static RAM arrays. Detection, isolation, and spare substitution of failed RAMs are performed automatically without the disruption of normal processing. A control store design with sparing is described. A mathematical model is used to predict reliability improvements for the multiple arrays for each processor board. The model takes into account the selected repair policy which calls for replacing a board only on spare exhaustion or on the failure of nonspared logic. The success of the chosen approach is illustrated through model predictions as well as through field failure data.<<ETX>>","PeriodicalId":230363,"journal":{"name":"[1989] The Nineteenth International Symposium on Fault-Tolerant Computing. Digest of Papers","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Reliable design of high-speed cache and control store memories\",\"authors\":\"R. Horst\",\"doi\":\"10.1109/FTCS.1989.105576\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The design of the cache and control store memories of the Tandem NonStop VLX processor is discussed. Service costs are reduced by using hot-standby sparing to improve the reliability of the large static RAM arrays. Detection, isolation, and spare substitution of failed RAMs are performed automatically without the disruption of normal processing. A control store design with sparing is described. A mathematical model is used to predict reliability improvements for the multiple arrays for each processor board. The model takes into account the selected repair policy which calls for replacing a board only on spare exhaustion or on the failure of nonspared logic. The success of the chosen approach is illustrated through model predictions as well as through field failure data.<<ETX>>\",\"PeriodicalId\":230363,\"journal\":{\"name\":\"[1989] The Nineteenth International Symposium on Fault-Tolerant Computing. Digest of Papers\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-06-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1989] The Nineteenth International Symposium on Fault-Tolerant Computing. Digest of Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/FTCS.1989.105576\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1989] The Nineteenth International Symposium on Fault-Tolerant Computing. Digest of Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FTCS.1989.105576","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Reliable design of high-speed cache and control store memories
The design of the cache and control store memories of the Tandem NonStop VLX processor is discussed. Service costs are reduced by using hot-standby sparing to improve the reliability of the large static RAM arrays. Detection, isolation, and spare substitution of failed RAMs are performed automatically without the disruption of normal processing. A control store design with sparing is described. A mathematical model is used to predict reliability improvements for the multiple arrays for each processor board. The model takes into account the selected repair policy which calls for replacing a board only on spare exhaustion or on the failure of nonspared logic. The success of the chosen approach is illustrated through model predictions as well as through field failure data.<>