Patrik Bansky, Elspeth Edelstein, Jeff Z. Pan, A. Wyner
{"title":"基于知识图谱的动态信息智能测量系统","authors":"Patrik Bansky, Elspeth Edelstein, Jeff Z. Pan, A. Wyner","doi":"10.1007/978-3-030-41407-8_15","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":305126,"journal":{"name":"Joint International Conference of Semantic Technology","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-11-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A Dynamic and Informative Intelligent Survey System Based on Knowledge Graph\",\"authors\":\"Patrik Bansky, Elspeth Edelstein, Jeff Z. Pan, A. Wyner\",\"doi\":\"10.1007/978-3-030-41407-8_15\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":305126,\"journal\":{\"name\":\"Joint International Conference of Semantic Technology\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-11-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Joint International Conference of Semantic Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/978-3-030-41407-8_15\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Joint International Conference of Semantic Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-030-41407-8_15","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}