带符号数字系统的算术电路的误差检测

Shugang Wei, K. Shimizu
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引用次数: 5

摘要

提出了一种基于基数-2符号数(SD)数算法的残差校验器,该校验器由若干残差算术电路组成。利用模m SD加法器的二叉树结构构造了快速模m(m=2/sup p//spl plusmn/1)乘法器和二位数到残数转换器。模m加法是通过使用p位SD加法器实现的,因此模m加法时间与操作数的字长无关。因此,模m乘法在与log/sub 2/p成比例的时间内进行,并在与log/sub 2/(n/p)成比例的时间内将n位二进制数转换为p位SD残数。所提出的残差算术电路可以应用于大型积和电路的错误检测。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Error detection of arithmetic circuits using a residue checker with signed-digit number system
An error detection method for arithmetic circuits is proposed, by using a residue checker which consists of a number of residue arithmetic circuits designed based on radix-2 signed-digit (SD) number arithmetic. Fast modulo m(m=2/sup p//spl plusmn/1) multipliers and binary-to-residue number converters are constructed with a binary tree structure of modulo m SD adders. The modulo m addition is implemented by using a p-digit SD adder, so that the modulo m addition time is independent of the word length of operands. Therefore, the modulo m multiplication is performed in a time proportional to log/sub 2/p and an n-bit binary number is converted into a p-digit SD residue number in a time proportional to log/sub 2/(n/p). The presented residue arithmetic circuits can be applied to error detection for a large product-sum circuit.
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