用于宽带通信系统的低成本栅格工程1.3-155 μ m波长波导/检测器/MMIC oeic

T. Childs, V. Sokolov, C. Sullivan
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引用次数: 0

摘要

利用分子束外延(MBE)和点阵工程技术,证明了在砷化镓上结合适用于1.3 ~ 1.55 /spl μ m波长范围的光子器件和单片微波(或毫米波)集成电路(mmic)的可行性。MBE生长的一个关键因素是砷化铟摩尔分数为0.35或更高的InGaAs活性层的掺入,以及它与底层半绝缘GaAs衬底的晶格相容性。用于光子器件的InGaAs层也可以作为用于mmic的伪晶高电子迁移率晶体管(phemt)的有源通道。该材料结构包括3层AlGaAs/GaAs/AlGaAs光波导和位于光波导正上方的薄InGaAs吸收层。在InGaAs层的顶表面形成金属-半导体-金属(MSM)光电探测器,用于收集光诱导载流子。给出了初步测量结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Low cost lattice-engineered 1.3-155 um wavelength waveguide/detector/MMIC OEICs for broadband communication systems
Using molecular beam epitaxy (MBE) and lattice engineering techniques, the feasibility of combining photonic devices applicable to the 1.3 to 1.55 /spl mu/m wavelength range and monolithic microwave (or mm-wave) integrated circuits (MMICs) on GaAs is demonstrated. A key factor in the MBE growth is incorporation of an InGaAs active layer having an indium arsenide mole fraction of 0.35 or greater and its lattic compatibility with the underlying semi-insulating GaAs substrate. The InGaAs layer used for the photonic devices can also serve as the active channel for the pseudomorphic high-electron-mobility transistors (PHEMTs) for application in MMICs. The material structure includes a 3-layer AlGaAs/GaAs/AlGaAs optical waveguide and a thin InGaAs absorbing layer situated directly above the optical waveguide. Metal-semiconductor-metal (MSM) photodetectors are formed on the top surface of the InGaAs layer for collection of the photo-induced carriers. Initial measurements are presented.
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