{"title":"1 GHz以下系统级大电流注入装置广义精确建模方法的实验验证","authors":"S. Miropolsky, S. Jahn, F. Klotz, S. Frei","doi":"10.1109/EMCCOMPO.2015.7358345","DOIUrl":null,"url":null,"abstract":"A small-signal model of an automotive system-level bulk current injection (BCI) setup developed with a generalized accurate method shown in the previous publication is verified on a case study with a demonstrator EUT module. The work utilizes an equivalent circuit modelling approach for the floating ungrounded EUT board and a macromodel for an active DUT IC. The simulation-based prediction of the BCI test results using an IC failure threshold and a small-signal simulation of RF levels at floating EUT module under BCI tests is shown. Due to high accuracy and detail of the BCI setup model, the prediction also shows very good correlation to real measurement data, both qualitatively and quantitatively, up to 1 GHz.","PeriodicalId":236992,"journal":{"name":"2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Experimental validation of the generalized accurate modelling method for system-level bulk current injection setups up to 1 GHz\",\"authors\":\"S. Miropolsky, S. Jahn, F. Klotz, S. Frei\",\"doi\":\"10.1109/EMCCOMPO.2015.7358345\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A small-signal model of an automotive system-level bulk current injection (BCI) setup developed with a generalized accurate method shown in the previous publication is verified on a case study with a demonstrator EUT module. The work utilizes an equivalent circuit modelling approach for the floating ungrounded EUT board and a macromodel for an active DUT IC. The simulation-based prediction of the BCI test results using an IC failure threshold and a small-signal simulation of RF levels at floating EUT module under BCI tests is shown. Due to high accuracy and detail of the BCI setup model, the prediction also shows very good correlation to real measurement data, both qualitatively and quantitatively, up to 1 GHz.\",\"PeriodicalId\":236992,\"journal\":{\"name\":\"2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMCCOMPO.2015.7358345\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCCOMPO.2015.7358345","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Experimental validation of the generalized accurate modelling method for system-level bulk current injection setups up to 1 GHz
A small-signal model of an automotive system-level bulk current injection (BCI) setup developed with a generalized accurate method shown in the previous publication is verified on a case study with a demonstrator EUT module. The work utilizes an equivalent circuit modelling approach for the floating ungrounded EUT board and a macromodel for an active DUT IC. The simulation-based prediction of the BCI test results using an IC failure threshold and a small-signal simulation of RF levels at floating EUT module under BCI tests is shown. Due to high accuracy and detail of the BCI setup model, the prediction also shows very good correlation to real measurement data, both qualitatively and quantitatively, up to 1 GHz.