具有高矩形迟滞特性的Pb(Zr0.4, Ti0.6)O3薄膜电容器的漏电流特性

S. Okamura, M. Tanimura, H. Shima, H. Naganuma
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引用次数: 0

摘要

采用铅含量为104 ~ 119%的前驱体溶液,采用化学溶液沉积法制备了顶部和底部为Pt电极的Pb(Zr0.4,Ti0.6)O3薄膜电容器。随着铅含量的增加,PZT电容器的漏电流密度单调降低。Pb110%-PZT电容器在RT下约80 kV/cm的电场下,导通机制由肖特基发射转变为普尔-弗伦克尔,而当铅含量较少时,漏电流仅受普尔-弗伦克尔限制。在Pb110%-PZT电容器中,肖特基势垒高度和相对介电常数分别为1.1 eV和4.8 eV, Poole-Frenkel传导中陷阱位点的活化能估计为0.5 eV。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Leakage Current Property of Pb(Zr0.4, Ti0.6)O3 Thin-film Capacitors with Highly Rectangular Hysteresis Property
The Pb(Zr0.4,Ti0.6)O3 thin-film capacitors with top and bottom Pt electrodes were prepared by chemical solution deposition using the precursor solutions with Pb contents ranging from 104 to 119%. Leakage current densities of the PZT capacitors monotonically decreased with increasing Pb contents. In the Pb110%-PZT capacitor, a conduction mechanism changed from the Schottky emission to the Poole-Frenkel at an electric field of approximately 80 kV/cm at RT while the leakage current was limited only by the Poole-Frenkel in case of less Pb contents. In the Pb110%-PZT capacitor, the Schottky barrier height and a relative permittivity were estimated to be 1.1 eV and 4.8, respectively, and the activation energy of trap sites in the Poole-Frenkel conduction was estimated to be 0.5 eV.
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