FRD反向恢复中电流细丝演变的负电阻现象新认识

2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) Pub Date : 2019-06-01 DOI:10.1109/EDSSC.2019.8754391

Peng Li, Chunlei Jia, Chenjing Liu, Shusheng Wang, Shengyang Xiong, Yu B. Wu

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引用次数: 0

摘要

本文首次揭示和解释了如何通过反向恢复I-V曲线中呈现的负电阻现象来理解和推断FRD中电流细丝的演变。对仿真数据的进一步研究表明，电压箝位周期的曲线形状是由孤立细丝的产生引起的，并讨论了它们之间的明确对应关系。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A New Insight into the Negative Resistance Phenomenon with the Evolution of Current Filaments in FRD’s Reverse Recovery

For the first time, this paper reveals and explains the details how to comprehend and deduce the evolution of current filaments in FRD by the negative resistance phenomenon presented in reverse recovery I-V curve. Further study on simulation data shows that the curve shape of voltage clamping period is caused by the generation of solitary filaments, and the definite correspondence relationship of them is discussed.

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2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)

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