一种可测试的高性能显示控制器(放射诊断设备)的实现

[1988] Proceedings. The Twentieth Southeastern Symposium on System Theory Pub Date : 1988-03-20 DOI:10.1109/SSST.1988.17119

J. Bou-Farhat, R. Makki, M. Allen, D. Anthony

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引用次数: 0

摘要

描述了用于诊断放射学的高性能显示控制器的VLSI实现的可测试性特征。专为测试而设计的特性以适度的开销覆盖了100%的硅区域。边界扫描、划分和结构化控制排序被用来提高集成电路的可验证性和可测试性。

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The implementation of a testable high performance display controller (diagnostic radiology equipment)

A description is given of the testability features of a VLSI implementation of a high-performance display controller for diagnostic radiology. The design-for-test features cover 100% of the silicon area at a modest overhead. Boundary-scan, partitioning, and structured control sequencing are used to enhance the verifiability and testability of the IC.<>

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[1988] Proceedings. The Twentieth Southeastern Symposium on System Theory

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