S. Ulrich, A. Wirick, D. de Araujo, N. Pham, M. Cases
{"title":"Nittany基因组计划:一种遗传算法方法来优化包模拟的最坏情况比特流","authors":"S. Ulrich, A. Wirick, D. de Araujo, N. Pham, M. Cases","doi":"10.1109/EPEP.2003.1250055","DOIUrl":null,"url":null,"abstract":"This paper describes the use of a genetic algorithm to optimize short bitstream inputs to produce approximately worst case jitter in package simulation. Theory behind the algorithm and its applicability to a server memory subsystem simulation is summarized. Custom software utilizing this algorithm and an example of its use are presented.","PeriodicalId":254477,"journal":{"name":"Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710)","volume":"532 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"The Nittany Genome Project: a genetic algorithm approach to optimize a worst case bitstream for package simulation\",\"authors\":\"S. Ulrich, A. Wirick, D. de Araujo, N. Pham, M. Cases\",\"doi\":\"10.1109/EPEP.2003.1250055\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes the use of a genetic algorithm to optimize short bitstream inputs to produce approximately worst case jitter in package simulation. Theory behind the algorithm and its applicability to a server memory subsystem simulation is summarized. Custom software utilizing this algorithm and an example of its use are presented.\",\"PeriodicalId\":254477,\"journal\":{\"name\":\"Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710)\",\"volume\":\"532 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-12-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEP.2003.1250055\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.2003.1250055","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The Nittany Genome Project: a genetic algorithm approach to optimize a worst case bitstream for package simulation
This paper describes the use of a genetic algorithm to optimize short bitstream inputs to produce approximately worst case jitter in package simulation. Theory behind the algorithm and its applicability to a server memory subsystem simulation is summarized. Custom software utilizing this algorithm and an example of its use are presented.