{"title":"高数值孔径聚焦系统中用于二维强度合成的瞳孔掩模","authors":"Leelada Rattanavija, S. Sherif, W. Mohammed","doi":"10.1117/12.863847","DOIUrl":null,"url":null,"abstract":"A high numerical aperture (NA) lens is used in many applications that require tightly focused beams including microscopy. The Debye-Wolf electromagnetic diffraction integral describes focusing by high NA lenses. Using an eigenfunction expansion of this integral, we numerically obtain a pupil mask that generates an arbitrary, within the diffraction limit, intensity distribution at the Gaussian focal plane.","PeriodicalId":245973,"journal":{"name":"Southeast Asian International Advances in Micro/Nano-technology","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Pupil masks for 2-D intensity synthesis in a high numerical aperture focusing system\",\"authors\":\"Leelada Rattanavija, S. Sherif, W. Mohammed\",\"doi\":\"10.1117/12.863847\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A high numerical aperture (NA) lens is used in many applications that require tightly focused beams including microscopy. The Debye-Wolf electromagnetic diffraction integral describes focusing by high NA lenses. Using an eigenfunction expansion of this integral, we numerically obtain a pupil mask that generates an arbitrary, within the diffraction limit, intensity distribution at the Gaussian focal plane.\",\"PeriodicalId\":245973,\"journal\":{\"name\":\"Southeast Asian International Advances in Micro/Nano-technology\",\"volume\":\"4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-05-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Southeast Asian International Advances in Micro/Nano-technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.863847\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Southeast Asian International Advances in Micro/Nano-technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.863847","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Pupil masks for 2-D intensity synthesis in a high numerical aperture focusing system
A high numerical aperture (NA) lens is used in many applications that require tightly focused beams including microscopy. The Debye-Wolf electromagnetic diffraction integral describes focusing by high NA lenses. Using an eigenfunction expansion of this integral, we numerically obtain a pupil mask that generates an arbitrary, within the diffraction limit, intensity distribution at the Gaussian focal plane.