{"title":"片上电压噪声监测器,用于使用数字测试仪测量供电线路中的电压反弹","authors":"H. Aoki, M. Ikeda, K. Asada","doi":"10.1109/ICMTS.2000.844416","DOIUrl":null,"url":null,"abstract":"With increasing interconnect densities, voltage bounce noise in power supply lines is becoming an important problem. In this paper, we describe a method to measure voltage bounce in a power supply line on a chip. We use a voltage comparator circuit to make the output a digital value. We connect this circuit in series to output the results with less pins.","PeriodicalId":447680,"journal":{"name":"ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095)","volume":"84 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-03-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"27","resultStr":"{\"title\":\"On-chip voltage noise monitor for measuring voltage bounce in power supply lines using a digital tester\",\"authors\":\"H. Aoki, M. Ikeda, K. Asada\",\"doi\":\"10.1109/ICMTS.2000.844416\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"With increasing interconnect densities, voltage bounce noise in power supply lines is becoming an important problem. In this paper, we describe a method to measure voltage bounce in a power supply line on a chip. We use a voltage comparator circuit to make the output a digital value. We connect this circuit in series to output the results with less pins.\",\"PeriodicalId\":447680,\"journal\":{\"name\":\"ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095)\",\"volume\":\"84 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-03-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"27\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMTS.2000.844416\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMTS.2000.844416","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
On-chip voltage noise monitor for measuring voltage bounce in power supply lines using a digital tester
With increasing interconnect densities, voltage bounce noise in power supply lines is becoming an important problem. In this paper, we describe a method to measure voltage bounce in a power supply line on a chip. We use a voltage comparator circuit to make the output a digital value. We connect this circuit in series to output the results with less pins.